1. Materials Analysis and Characterization

Objectives:

• Quality control of materials (minerals, crystals, finished products)
• Study of physical phenomena (wear, aging, fatigue)
• Help improve industrial processes
• Development of analytical methods
• Specialized training

Equipment:

• X-ray powder diffractometers, thin films
• X-ray reflectivity (XRR)
• GIXRD
• SAXS
• H-XRD
• Scanning Electron Microscopes (Environmental) - EDX
• Transmission Electron Microscopes - EDX
• X-ray fluorescence (XRF)